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Bruker AXS Announces Agreement to Acquire Atomic Force Microscopy (AFM) Company S.I.S. Surface Imaging Systems GmbH

August 18, 2008 07:05 AM Eastern Time

NANOStation HD - an automated platform for combined optical and AFM measurements, combining a high quality research microscope, a scriber, and SIS' ULTRAObjective Atomic Force Microscope on an automated platform. (Photo: Business Wire)

NANOStation HD - an automated platform for combined optical and AFM measurements, combining a high quality research microscope, a scriber, and SIS' ULTRAObjective Atomic Force Microscope on an automated platform. (Photo: Business Wire)

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NANOStation HD - an automated platform for combined optical and AFM measurements, combining a high quality research microscope, a scriber, and SIS' ULTRAObjective Atomic Force Microscope on an automated platform. (Photo: Business Wire)

NANOStation HD - an automated platform for combined optical and AFM measurements, combining a high quality research microscope, a scriber, and SIS' ULTRAObjective Atomic Force Microscope on an automated platform. (Photo: Business Wire)

http://eon.businesswire.com/multimedia/eon/20080818105208/en/1680597

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News > News Release: Bruker AXS Announces Agreement to Acquire Atomi...