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Bruker AXS Announces Closing of S.I.S. Acquisition and Exhibits its New Atomic Force Microscopy (AFM) Product Line at EMC 2008

The NANOStation 300 features a flexible sub-Angstrom resolution AFM/SPM system combined with high-end optical tools for samples up to 300 mm size on an automated speedy and accurate stage. (Photo: Business Wire)
The NANOStation 300 features a flexible sub-Angstrom resolution AFM/SPM system combined with high-end optical tools for samples up to 300 mm size on an automated speedy and accurate stage. (Photo: Business Wire)

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